Introduction

X-ray microanalysis is an analytical technique for determination of the chemical composition of solid samples, thin layers or particles in electron microscopes. Using our QUANTAX ED energy dispersive X-ray spectrometry system (EDS) it is possible to detect and analyze all elements from beryllium to americium simultaneously. Obtaining elemental information from a sample volume of only a few microns and providing relative detection limits in the order of a tenth of mass percent makes X-ray microanalysis one of the most sensitive analysis methods available.

The QUANTAX ED family of EDS systems offered by Bruker AXS Microanalysis delivers reliable results across a broad range of applications with unprecedented speed, accuracy and ease of use.

Bruker's unique, liquid nitrogen free XFlash® silicon drift detectors (SDD) together with the state-of-the-art hybrid pulse processor technology deliver both the highest possible energy resolution and over ten times the speed of conventional Si(Li) based systems.

The new QUANTAX CrystAlign EBSD system combines information on sample chemistry (EDS) with information on sample structure. It so provides the analyst with more understanding of material properties. CrystAlign is designed to be an easy-to-use system, making the actually complicated EBSD technique much more accessible to the general user.

QUANTAX also features the powerful ESPRIT software with an intuitive interface. With true standardless analysis, proven standards based quantification, or even a combination of both methods, ESPRIT offers optimal tools for any analytical application.

Please visit our information request page should you require additional information.